Place of birth | Nakhichevan | ![]() |
Date of birth | 07.06.1937 | |
Education | Moscow State University | |
Scientific degree | Doctor of sciences by physics | |
Title | Docent | |
Topic of PhD thesis:
- specialty code - specialty name - topic name |
01.04.10 Physics of semiconductors and insulators Investigation of reactive properties of diffused diodies on base n- and p- Si |
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Topic of doctoral thesis:
- specialty code - specialty name - topic name |
01.04.04. Physical Electronics Ge, Si with deep impurity of levels and non-stationary electronic processes in barrier structures on their basis |
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Total number of printed scientific publications:
- number of scientific publications printed abroad: - number of papers published in journals indexed and abstracted in international databases |
140
50 30 |
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Number of patents and certificates of authorship | 5 | |
Staff training:
- number of PhD - number of Doctor of sciences |
3 |
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Basic scientific achievements | 1. There has be first shown possibility of obtaining p-n junction in Al-SiO2-nSi-M structure without high-temperature diffusion, application of electric field by Al transfer through the channel in the oxide in Si. The metod of manufacturing of the switch on a basis n-Si developed, and a cell of memory with electric rewriting and a diode matrix with identical parameters of a direct rewriting and a diode matrix with identical parameters of direct voltage drop are offered.
2. There have been shown possibility of In2O3-SiO2-pSi-SiO2-Al structure photosensivity control with applied voltage. 3. Deals with the complex investigated by method of non-stationary capacity spectroscopy photocapacity, photoconductivity and electron paramagnetic resonance of non-stationary electron processes in p-n and MIS-structures made on Si and Ge –based with deep impurities of transition metals (Ni, W, Ti and Ta).It was obtaining main parameters of deep levels. |
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Names of scientific works | 1. Investigation of p-n junctions n- Si obtained by electromigration of Al through a thin SiO2film. Sol. State Commun. 1984,v. 49, №3, p.273-278, №3,c.52
2. Исследование влияния электронного облучения на структуру GaSe-SiO2 ФТП, 2002, т.36, №7, с.858-860 3. Диэлектрические свойства пленок SiOx переменного состава Fizika 2008, том.14, №3,с.52, 4. Влияние электроактивного никеля на свойства Ni.Неорганические материалы , 2010, т.46, вып.10, с. 1163-1166, 5. Влияние эмиттерного тока на свойства коллекторного перехода Si и Ge структур. Неорганические материалы, 2012, том.47,№3, с.261-265 6. Jafarova E.A, Z.Y.Sadygov, F.I.Ahmadov, A.Z.Sadyqov, A.A.Dovlatov, L.A.Aliyeva, E.S.Tapdyqov Features of barrier capacitance mikropixel avalanche Photodiodes at different frequencies. Universal journal of Physics and Applications, 2016 , v. 10 ,№1,p 1-4 |
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Membership with international and foreign scientific organizations | ||
Pedagogical activity | 1977-1985- Department of Electronics, Azerbaijan Technical University | |
Other activities | Institute of Physics National Academy of Sciences, member of the Scientific Council | |
Awards and prizes | Grants:
1. The joint grant of National Academies of sciences of Azerbaijan and Belarus. Development of technology for thin-film solar cells based on chalcopyrite semiconductors. 2010. 2. The regular Grant of STCU - 5611. “Obtaining and investigation of thin film Solar Cells on the basis of Сu(İnGa)(Se,S)2 materials with chalcopyrite structures”. 2012 |
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Main place of work and its address | Institute of Physics of ANAS, Baku , G. Javid ave. 131 | |
Position | Leading of Laboratories | |
Office phone | (+994 12) 5394057 | |
Mobile | (+994 51) 8875223 | |
Home phone | (+994 12) 4408322 | |
Fax | ||
celmira1@rambler.ru |